New research paper titled “Mapping of the mechanical response in Si/SiGe nanosheet device geometries” from researchers at IBM T.J. Watson Research Center and Brookhaven National Laboratory. Sponsored ...
Accelerating Next-Gen Memory and Logic with Ultrafast, Non-Destructive Metrology Against a background of demand for generative AI and data centers, scaling and 3D realization of semiconductors are ...
Enhancement of the Petawatt laser "LFEX" [1] up to 2,000 trillion watts for one trillionth of one second. High power output implemented by a 4-beam amplifier technology and the world's highest ...
Pulsed neutron strain scanning is a powerful non-destructive technique capable of measuring stress fields deep within engineering components. Now a team from the Open University and the ISIS neutron ...
Press Contact: Sawa Himeno Head of Communications Dept., Rigaku Holdings Corporation [email protected] Tel: +81 90 6331 9843 Rigaku Corporation, a global solution partner in X-ray metrology systems ...
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